Vehicle recall defect – Hino Is Recalling Certain Model Year 2005 Through 2013 Medium Duty Trucks, Models Na6J, Nb6J, Nc6J, Nd8J, Ne8J, Nj8J, Nf8J, And Nv8J, Manufactured From August 18, 2003, Through November 16, 2011. Over Time, The Main B+ Circuit From The Battery To The Starter Could Potentially Short To Ground Due To Wear That Accumulates As A Result Of Interference Between The B+ Circuit And Its Convoluted Tubing Sheath.
Vehicle recall defect – Hino Is Recalling Certain Model Year 2005 Through 2013 Medium Duty Trucks, Models Na6J, Nb6J, Nc6J, Nd8J, Ne8J, Nj8J, Nf8J, And Nv8J, Manufactured From August 18, 2003, Through November 16, 2011. Over Time, The Main B+ Circuit From The Battery To The Starter Could Potentially Short To Ground Due To Wear That Accumulates As A Result Of Interference Between The B+ Circuit And Its Convoluted Tubing Sheath.
Vehicle recall defect – Hino Motor Sales U.S.A., Inc. (Hino) Is Recalling Certain Model Year 2005-2015 Hino Nd8J, Ne8J, And Nf8J Trucks Manufactured August 26, 2003, To May 14, 2014. In The Affected Vehicles, Components Of The Parking Brake Handle Assembly May Wear, Resulting In Either The Parking Brake Unexpectedly Releasing When Engaged Or Preventing The Parking Brake From Fully Engaging.
Vehicle recall defect – Hino Is Recalling Certain Model Year 2005 Through 2013 Medium Duty Trucks, Models Na6J, Nb6J, Nc6J, Nd8J, Ne8J, Nj8J, Nf8J, And Nv8J, Manufactured From August 18, 2003, Through November 16, 2011. Over Time, The Main B+ Circuit From The Battery To The Starter Could Potentially Short To Ground Due To Wear That Accumulates As A Result Of Interference Between The B+ Circuit And Its Convoluted Tubing Sheath.
Vehicle recall defect – Hino Is Recalling Certain Model Year 2005 Through 2013 Medium Duty Trucks, Models Na6J, Nb6J, Nc6J, Nd8J, Ne8J, Nj8J, Nf8J, And Nv8J, Manufactured From August 18, 2003, Through November 16, 2011. Over Time, The Main B+ Circuit From The Battery To The Starter Could Potentially Short To Ground Due To Wear That Accumulates As A Result Of Interference Between The B+ Circuit And Its Convoluted Tubing Sheath.
Vehicle recall defect – Hino Motor Sales U.S.A., Inc. (Hino) Is Recalling Certain Model Year 2005-2015 Hino Nd8J, Ne8J, And Nf8J Trucks Manufactured August 26, 2003, To May 14, 2014. In The Affected Vehicles, Components Of The Parking Brake Handle Assembly May Wear, Resulting In Either The Parking Brake Unexpectedly Releasing When Engaged Or Preventing The Parking Brake From Fully Engaging.
Vehicle recall defect – Hino Is Recalling Certain Model Year 2005 Through 2013 Medium Duty Trucks, Models Na6J, Nb6J, Nc6J, Nd8J, Ne8J, Nj8J, Nf8J, And Nv8J, Manufactured From August 18, 2003, Through November 16, 2011. Over Time, The Main B+ Circuit From The Battery To The Starter Could Potentially Short To Ground Due To Wear That Accumulates As A Result Of Interference Between The B+ Circuit And Its Convoluted Tubing Sheath.
Vehicle recall defect – Hino Is Recalling Certain Model Year 2005 Through 2013 Medium Duty Trucks, Models Na6J, Nb6J, Nc6J, Nd8J, Ne8J, Nj8J, Nf8J, And Nv8J, Manufactured From August 18, 2003, Through November 16, 2011. Over Time, The Main B+ Circuit From The Battery To The Starter Could Potentially Short To Ground Due To Wear That Accumulates As A Result Of Interference Between The B+ Circuit And Its Convoluted Tubing Sheath.
Vehicle recall defect – Hino Motor Sales U.S.A., Inc. (Hino) Is Recalling Certain Model Year 2005-2015 Hino Nd8J, Ne8J, And Nf8J Trucks Manufactured August 26, 2003, To May 14, 2014. In The Affected Vehicles, Components Of The Parking Brake Handle Assembly May Wear, Resulting In Either The Parking Brake Unexpectedly Releasing When Engaged Or Preventing The Parking Brake From Fully Engaging.
Vehicle recall defect – Hino Is Recalling Certain Model Year 2005 Through 2013 Medium Duty Trucks, Models Na6J, Nb6J, Nc6J, Nd8J, Ne8J, Nj8J, Nf8J, And Nv8J, Manufactured From August 18, 2003, Through November 16, 2011. Over Time, The Main B+ Circuit From The Battery To The Starter Could Potentially Short To Ground Due To Wear That Accumulates As A Result Of Interference Between The B+ Circuit And Its Convoluted Tubing Sheath.